Implementation of Metastability Errors in CMOS Interface Circuits

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Research areas:
Year:
2014
Type of Publication:
Article
Keywords:
Metastability, Steup Time, Hold Time, Propagation Delay, MTBF Mean Time Between Failure
Authors:
Maryam Saleem Qureshi; Prof. Soheb Munir
Journal:
IJAIM
Volume:
3
Number:
1
Pages:
16-18
Month:
July
Abstract:
The integrated chips uses the millions of flip flops as a storing device. With continuous scaling deep into the sub-nm region the amount of charge which holds the data has decreased to the point where faults such as metastability occurs in IC have become a dominant failure mechanism which may corruption of the stored data. Metastability is an incident where the bi-stable element such as flip-flop goes in an unwanted state in which the output is at an midway level between binary logic “0” and binary logic “1.” With time any bi-stable element will resolve, however the time allowed for synchronization of digital data paths must be small to retain system performance.
Full text: IJAIM_315_Final.pdf

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