Microcontroller Based Design of Digital IC Tester with Multi-Testing and Loop Testing Functions

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Auto-Detection, IC Tester, Multi-Test, ZIF Socket
Maribelle D. Pabiania; Joanne T. Peralta; Leo Anthony T. De Luna
This paper describes a microcontroller-based IC tester with dual logic gates testing. The design is implemented by using STC12C5A32 microcontroller chip where the processing of the inputs and outputs was done by the microcontroller. The display part on the microcontroller chip was represented using the Liquid Crystal Display (LCD). The basic function of this tester was to test a digital IC for correct logical functioning as described in the truth table and/or function table. It can test a digital IC having a maximum of 28 pins and test up to two ICs at a time with not more than 14 pins each. This model applies the necessary signals to the inputs of the logic device, monitoring the outputs at each stage and comparing them with the outputs in the truth table. The system would go through all the test libraries to check if the inserted DUT have exactly matched the correct outputs of one of the truth tables. If the outputs of the Device Under Test (DUT) are identical with one of the IC test cases, the system would output the respective IC number and display the message “Good”. If not, the system will display the message “Bad IC on socket N”, which “N” denotes the socket number. The testing procedure was accomplished with the help of ZIF socket on which the DUT was inserted. It has the capability to auto-detect an unknown IC number, thus the user does not need to enter an IC number. It also has loop-test function which enables the user to retest the inserted DUT by pressing reset button followed by the test key. An additional feature of the system is that, it has optional programming facility so that the user can reprogram or add a test-library. Based on the gathered data and computations, the created system was proven to be reliable in terms of accuracy since the computed percent error is 5.88%.
Full text: IJAIM_277_Final.pdf

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